%0 Journal Article
%T Adaptaci¨®n y validaci¨®n de la Entrevista de Carga familiar Objetiva y Subjetiva (ECFOS) en poblaci¨®n chilena
%A Grand¨®n F
%A Pamela
%A Saldivia B
%A Sandra
%A Melipill¨¢n A
%A Roberto
%A Pihan V
%A Rolando
%A Albornoz R
%A Edith
%J Revista chilena de neuro-psiquiatr¨ªa
%D 2011
%I Scientific Electronic Library Online
%R 10.4067/S0717-92272011000400003
%X introduction: the term 'burden' refers to the negative consequences resulting from providing care to a patient with a serious mental disease. the aim of this study is to adapt and validate the subjective and objective family burden interview (ecfos) in a sample of caregivers ofpatients with schizophrenia, by assessing the construct validity of the survey and its reliability in terms of internal consistency and temporal stability. method: a total of 150 primary caregivers ofpatients with schizophrenia were interviewed with the subjective and objective family burden interview (ecfos), the multidimensional scale of perceived social support (mspss), the zarit scale for assessing caregiver burden and the world health organization quality of life questionnaire (whoqol-brief). results: the exploratory factor analysis showed the existence of six factors that explain 45.21% of the variance. the internal consistency of each of the factors after the first application ofthe instrument yielded alpha values thatfluctuated from 0.77 to 0.88, while after the second application, such values ranged from 0.67 to 0.87. regarding the test-retest reliability, after an interval of a month moderate to high correlations were found, ranging from 0.49 to 0.77. conclusions: in spite of the differences found between the original spanish version of the instrument and its adapted version, the results obtained demonstrate that the adapted version of the subjective and objective family burden interview is a valid and reliable instrument to assess the burden presented by patients with schizophrenia to their primary caregivers.
%K burden
%K mental illness
%K caregiver.
%U http://www.scielo.cl/scielo.php?script=sci_abstract&pid=S0717-92272011000400003&lng=en&nrm=iso&tlng=en