%0 Journal Article %T Spectral data processing based on wavelet analysis
基于小波分析的光谱数据处理 %A MA Cui-hong %A LIU Li-ye %A
马翠红 %A 刘立业 %J 冶金分析 %D 2012 %I %X Atomic emission spectrometry has been considered as a potential in-situ technology because of its advantage of simultaneous multi-elements analysis ability.Since the spectral data are large with the coexisting of interference information and effective information,it is disadvantageous to the qualitative and quantitative analysis.The wavelet analysis has the special advantages of fine expression in time division & frequency division and multiscale & multiresolution analysis.The technical principle of wavelet analysis to remove noise is introduced.Through the noise removal of a group of spectral data,it is indicated that the wavelet analysis method can effectively reduce the interference information in spectrum. %K atomic emission spectrometry %K wavelet analysis %K spectral data %K denoise
原子发射光谱 %K 小波分析 %K 光谱数据 %K 去噪 %U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=2D0EECBAB3CF5455&jid=801503686266675EACDCAD01FB961264&aid=09A83131469FC5D477201D4C735694F7&yid=99E9153A83D4CB11&vid=9971A5E270697F23&iid=CA4FD0336C81A37A&sid=339D79302DF62549&eid=42425781F0B1C26E&journal_id=1000-7571&journal_name=冶金分析&referenced_num=0&reference_num=0