%0 Journal Article
%T Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM
%A Xiaoxing Ke
%A Carla Bittencourt
%A Sara Bals
%A Gustaaf Van Tendeloo
%J Beilstein Journal of Nanotechnology
%D 2013
%I 
%R 10.3762/bjnano.4.9
%X Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt nanoclusters are well-dispersed, covering the selected areas of the CNT surface completely. The ability of FEBID to graft nanoclusters on multiple sides, through an electron-transparent target within one step, is unique as a physical deposition method. Using high-resolution TEM we have shown that the CNT structure can be well preserved thanks to the low dose used in FEBID. By tuning the electron-beam parameters, the density and distribution of the nanoclusters can be controlled. The purity of as-deposited nanoclusters can be improved by low-energy electron irradiation at room temperature.
%K carbon nanotubes
%K FEBID
%K nanocluster
%K platinum
%K patterning
%K radiation-induced nanostructures
%K TEM
%U http://dx.doi.org/10.3762/bjnano.4.9