%0 Journal Article
%T Determination of radiation resistance of integrated circuits with the use of low-energy X-radiation
%A Perevertailo V. L.
%J Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
%D 2012
%I Politehperiodika
%X A method is proposed for determination of radiation dose via the ionization current in the p¡ªn-junction and of radiation resistance of MIS integrated circuits with the use of low-energy (10¡ª40 keV) X-rays.
%K radiation testing
%K low-energy X-rays
%K MOS-structure
%K IC radiation hardness
%U http://www.tkea.com.ua/tkea/2012/1_2012/pdf/07.zip