%0 Journal Article
%T Thermal mathematical model of semiconductor devices for measurement of current-voltage characteristics by pulse method
%A Yermolenko Ye. O.
%A Bondarenko O. F.
%A Baranov O. M.
%J Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
%D 2012
%I Politehperiodika
%X The thermal mathematical model is used to estimate self-heating of semiconductor devices of various types during current-voltage characteristics measuring by the pulse method. The influence of self-heating on electrical parameters of semiconductor devices is analyzed. The recommendations for determination of values of measuring pulse sequence parameters are formulated to minimize self-heating of semiconductor structure.
%K current-voltage characteristics
%K semiconductor device
%K pulse method of measurement
%K thermal model
%U http://www.tkea.com.ua/tkea/2012/5_2012/pdf/03.zip