%0 Journal Article
%T Reliable and Damage-Free Estimation of Resistivity of ZnO Thin Films for Photovoltaic Applications Using Photoluminescence Technique
%A N. Poornima
%A T. V. Vimalkumar
%A V. G. Rajeshmon
%A C. Sudha Kartha
%J International Journal of Photoenergy
%D 2013
%I Hindawi Publishing Corporation
%R 10.1155/2013/105796
%U http://dx.doi.org/10.1155/2013/105796