%0 Journal Article
%T RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION
%A G. Srinivasa Rao
%A R.R.L. Kantam
%A K.Rosaiah
%A S.V.S.V.S.V. Prasad
%J Journal of Reliability and Statistical Studies
%D 2012
%I Ankur Printing Palace
%X In this paper we consider a generalization of the log- logistic distribution called Type-IIexponentiated log- logistic distribution suggested by Kotz and Nadarajah (2000). The operatingcharacteristic for a sampling plan is determined for the case that a lot of products are submittedfor inspection with lifetimes specified by a Type-II exponentiated log- logistic distribution(TELLD). The results are illustrated by a numerical example.
%K Type-II Exponentiated Log- logistic Distribution
%K Reliability Test Plans
%U http://www.jrss.in/data/5I16.pdf