%0 Journal Article
%T Effects of Ambient Gases on the Electrical Performance of Solution-Processed C8-BTBT Thin-Film Transistors
%A Aihua Zhang
%A Chunlai Luo
%A Guofu Zhou
%A J-M Liu
%A Jiaying Mai
%A Jinwei Gao
%A Min Zeng
%A Naiwei Tang
%A Sujuan Wu
%A Waner He
%A Xubing Lu
%A Zhen Fan
%A Zhengmiao Zou
%J Archive of "Nanoscale Research Letters".
%D 2019
%R 10.1186/s11671-019-3007-x
%X (Color online) (a) A schematic diagram of the device structure. (b) The molecular structures of the C8-BTBT, molybdenum oxide, and PMMA used in the experiment. (c) AFM surface morphology image of the C8-BTBT film indicating a small RMS value of 2.08£¿nm. (d) Test procedures used to measure the electrical performance characteristics of 70£¿units of each device type (high vacuum, nitrogen atmosphere, oxygen atmosphere, and air atmosphere
%K Solution process
%K C8-BTBT
%K Thin-film transistors
%K Air stability
%K Ambient gases
%U https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6529505/