%0 Journal Article
%T Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films
%A Nam Joong Jeon
%A Jangwon Seo
%A Yanghee Kim
%A Ji Yeong Lee
%A Sugyeong Hong
%A Sun Hee Kim
%A Jung-Keun Lee
%J Advances in Chemical Engineering and Science
%P 87-95
%@ 2160-0406
%D 2022
%I Scientific Research Publishing
%R 10.4236/aces.2022.122007
%X FAMn:PbI3 perovskite films were synthesized and probed mainly through
electron spin resonance (ESR) spectroscopy. FAMn:PbI3 with low (~1%)
Mn concentration showed a hyperfine sextet line originated from Mn++ ions. FAMn:PbI3 with high (10%) Mn concentration showed broad
resonance (~500 G peak-to-peak linewidth).
However, after bombardment of FAMn:PbI3 with high Mn
concentration by focused ion beams (FIB), a sharp ESR peak appeared. The
peak-to-peak linewidth (ждHpp) was ~8 G regardless of the
temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K -
50 K), which indicates the presence of localized electrons at the defect sites
at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the
temperature increased from 5 K to 50 K. Together with the ongoing search for
electron spin echo (ESE), this could potentially provide a platform for realizing
magnetic bits, information storage, and increased manipulation speed.
%K Perovskite Manganites
%K FIB
%K Paramagnetic Spins
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=116120