%0 Journal Article %T Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films %A Nam Joong Jeon %A Jangwon Seo %A Yanghee Kim %A Ji Yeong Lee %A Sugyeong Hong %A Sun Hee Kim %A Jung-Keun Lee %J Advances in Chemical Engineering and Science %P 87-95 %@ 2160-0406 %D 2022 %I Scientific Research Publishing %R 10.4236/aces.2022.122007 %X FAMn:PbI3 perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI3 with low (~1%) Mn concentration showed a hyperfine sextet line originated from Mn++ ions. FAMn:PbI3 with high (10%) Mn concentration showed broad resonance (~500 G peak-to-peak linewidth). However, after bombardment of FAMn:PbI3 with high Mn concentration by focused ion beams (FIB), a sharp ESR peak appeared. The peak-to-peak linewidth (ждHpp) was ~8 G regardless of the temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K - 50 K), which indicates the presence of localized electrons at the defect sites at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the temperature increased from 5 K to 50 K. Together with the ongoing search for electron spin echo (ESE), this could potentially provide a platform for realizing magnetic bits, information storage, and increased manipulation speed. %K Perovskite Manganites %K FIB %K Paramagnetic Spins %U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=116120