%0 Journal Article
%T Optimization of Crystal Structure Based on Experimentally Obtained XRD Patterns for Fluorescence of Sm<sup>3+</sup>-Doped TiO<sub>2</sub> Thin Films by Machine Learning
%A Yuri Tamamoto
%A Mariko Murayama
%A Xiwei Zhao
%J Optics and Photonics Journal
%P 147-155
%@ 2160-889X
%D 2022
%I Scientific Research Publishing
%R 10.4236/opj.2022.126011
%X The luminescence intensity of rare-earth ion-doped luminescent materials is closely related to the configuration of the anions around the rare-earth ions added to the host material and the lattice defects. And it is expected that this information will be reflected in the XRD pattern. In this study, the lumines-cence data and XRD patterns of Sm-doped TiO<sub>2</sub> accumulated by our group are used to construct a model to predict the integrated luminescence intensity. The model was confirmed to be able to predict the integrated luminescence in-tensity with high accuracy. Furthermore, we found that the integrated lumi-nescence intensity of this system is closely related to the change in the position of the peak on the (200) plane of TiO<sub>2</sub>.
%K Machine Learning
%K Phosphor
%K TiO&lt
%K sub&gt
%K 2&lt
%K /sub&gt
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=118067