%0 Journal Article
%T 基于GIS空间分析的三线工业遗存保护再利用研究——以自贡电焊条厂为例<br>Research on the Protection and Reuse of Third-Line Industrial Relics Based on GIS Spatial Analysis: A Case Study of Zigong Electric Welding Electrode Factory
%A 刘芯
%A 向铭铭
%J Urbanization and Land Use
%P 13-23
%@ 2332-791X
%D 2023
%I Hans Publishing
%R 10.12677/ULU.2023.111003
%X 在全国老工业城市加快推进高质量发展的新形势下，工业遗存作为我国工业文化重要的物质载体，承载着城市不同历史发展阶段的面貌与时代记忆，是城市文化的主要构成元素。时过境迁，曾经促进城市发展的传统工业逐渐迁移城市核心，工厂旧址衰败、弃置，导致与城市发展脱节，造成城市土地资源浪费。作为重要的存量资源，如何通过保护再利用，更好地辐射周边区域，促进产业转型，带动城市复兴，是工业遗存研究的重要内容。本文综合运用POI数据核密度分析、SWOT分析模型，以自贡电焊条厂为研究对象，重点分析三线工业遗存发展中面临的优势、劣势、机会和威胁，并为城市工业遗存再利用在规划层面提供策略建议。<br />
Under the new situation of accelerating the high-quality development of old industrial cities in China, industrial heritage, as an important material carrier of China’s industrial culture, carries the appearance and memory of the times of different historical development stages of the city, and is the main component element of urban culture. With the passage of time, the traditional industries that once promoted urban development have gradually moved to the urban core, and the old factory sites have decayed and been abandoned, resulting in disconnection with urban develop-ment and waste of urban land resources. As an important stock resource, how to better radiate the surrounding areas, promote industrial transformation and drive urban rejuvenation through protection and reuse is an important part of the research on industrial heritage. This paper com-prehensively uses POI data kernel density analysis and SWOT analysis model, takes Zigong welding electrode factory as the research object, focuses on analyzing the advantages, disadvantages, opportunities and threats faced in the development of third-tier industrial remains, and provides strategic suggestions for the reuse of urban industrial relics at the planning level.
%K 工业遗存，核密度分析，SWOT分析，保护再利用，策略研究<br>Industrial Remains
%K GIS Analysis
%K SWOT Analysis
%K Protect Reuse
%K Strategic Research
%U http://www.hanspub.org/journal/PaperInformation.aspx?PaperID=62148