%0 Journal Article
%T Depth Profile Study of Electroless Deposited Sb<sub>2</sub>S<sub>3</sub> Thin Films Using XPS for Photovoltaic Applications
%A Towhid Adnan Chowdhury
%J Materials Sciences and Applications
%P 397-406
%@ 2153-1188
%D 2023
%I Scientific Research Publishing
%R 10.4236/msa.2023.147025
%X Sb<sub>2</sub>S<sub>3</sub> has gained tremendous research recently for thin film solar cell absorber material because of their easy synthesis, unique electrical and optical properties. The stoichiometry and composition of electroless Sb<sub>2</sub>S<sub>3</sub> thin films were analyzed using XPS depth profile studies. The surface layers were found nearly stoichiometric. On the other hand, the inner layer was rich in antimony composition making it more conductive electrically.
%K Sb&lt
%K sub&gt
%K 2&lt
%K /sub&gt
%K S&lt
%K sub&gt
%K 3&lt
%K /sub&gt
%K Depth Profiling
%K X-Ray Photoelectron Spectroscopy
%K Thin Film
%K Electroless
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=126384