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ISSN: 2333-9721
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Metrology and Measurement Systems

ISSN Print: 0860-8229

ISSN Online:

主页: http://versita.metapress.com/content/121826/?p=0cf16e2f81f3485998549ef706e04ed1&pi=199

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Measurements of QoS/QoE Parameters for Media Streaming in a PMIPv6 Testbed with 802.11 b/g/n WLANs

M. Hoeft, K. Gierlowski, T. Gierszewski, J. Konorski, K. Nowicki, J. Wozniak

Evaluation of Multimedia Applications in a Cluster-Oriented Environment

Pawe Czarnul, Tomasz Dziubich, Henryk Krawczyk

Diagnosis of Incipient Faults in Nonlinear Analog Circuits

Yong Deng, Yibing Shi, Wei Zhang

Assessment of Cardiovascular Risk in Assisted Living

Jerzy Wtorek, Adam Bujnowski, Jacek Rumiński, Artur Poliński, Mariusz Kaczmarek, Antoni Nowakowski

Liveness Measurements Using Optical Flow for Biometric Person Authentication

Maciej Smiatacz

Standard Deviation of the Mean of Autocorrelated Observations Estimated with the Use of the Autocorrelation Function Estimated From the Data

Andrzej Zi ba, Piotr Ramza

Soft Fault Clustering in Analog Electronic Circuits with the Use of Self Organizing Neural Network

Damian Grzechca

Active Power Measurements - An Overview and a Comparison of DSP Algorithms by Noncoherent Sampling

Milos Sedlacek, Zdenek Stoudek

Estimation of the Amplitude Square Using the Interpolated Discrete Fourier Transform

Toma Lu in, Du an Agre

Infrared Imaging Fourier Transform Spectrometer as the Stand-Off Gas Detection System

Mariusz Kastek, Tadeusz Pi tkowski, Piotr Trzaskawka

Parameters for CMM Contact Measurements of Free-Form Surfaces

Ma gorzata Poniatowska

The Influence of the Load on the Hardness

Jozef Petrík, Pavol Palfy

64 Channel Neural Recording Amplifier with Tunable Bandwidth in 180 nm CMOS Technology

Pawe Grybo , Piotr Kmon, Miros aw o d , Robert Szczygie , Maciej Kachel, Marian Lewandowski, Tomasz B asiak

Application of Sensitivity Analysis to the Correction of Static Characteristics of a Phase Angle Modulator

Ryszard Sroka

A Velocity Measurement Method Based on Scaling Parameter Estimation of a Chaotic System

Lidong Liu, Jifeng Hu, Zishu He, Chunlin Han, Huiyong Li, Jun Li

Optical Multi-Sensor Metrology for Extruded Profiles

Albert Weckenmann , Johannes Bernstein

The Choice Between Analog or Digital AC Power Measurement in a Vodafone Base Station Data Logger

Francisco C. Alegria , Francisco M. Travassos

The Quantum SI - Towards the New Systems of Units

Waldemar Nawrocki

Advanced User Interface Generation in the Software Framework for Magnetic Measurements at Cern

Pasquale Arpaia , , Lucio Fiscarelli , , Giuseppe La Commara

Effective Number of Observations and Unbiased Estimators of Variance for Autocorrelated Data - an Overview

Andrzej Zi ba

Current Measurements and Analysis for Induction Motor Diagnostics

Leon Sw drowski

Approximation of Thermal Background Applied to Defect Detection using the Methods of Active Thermography

Sebastian Dudzik

Fitting Spatial Models of Geometric Deviations of Free-Form Surfaces Determined in Coordinate Measurements

Ma gorzata Poniatowska, Andrzej Werner

Holistic Qualification in Manufacturing Metrology by Enhancing Knowledge Exchange Among Different User Groups

Albert Weckenmann , Teresa Werner

A Reconstruction Method of Generalized Sampling Based on Generalized Inverse

Zhu Zhaoxuan, Wang Houjun, Wang Zhigang, Zhang Hao

Uncertainty Interval Evaluation Using the Chi-Square and Fisher Distributions in the Measurement Process

Marcantonio Catelani, Andrea Zanobini, Lorenzo Ciani

Investigating Advantages and Disadvantages of the Analysis of a Geometrical Surface Structure with the Use of Fourier and Wavelet Transform

Stanis aw Adamczak, W odzimierz Makie a, Krzysztof St pień

Comparative Analysis of Three Algorithms for Two-Channel Common Frequency Sinewave Parameter Estimation: Ellipse Fit, Seven Parameter Sine Fit and Spectral Sinc Fit

Pedro M. Ramos, Fernando M. Janeiro, Tomá Radil

Measurement and Analysis of Thermal Parameters and Efficiency of Laser Heterostructures and Light-Emitting Diodes

Yurii A. Bumai , Aleh S. Vaskou , Valerii K. Kononenko

Signal Processing in Partial Discharge Measurement

Josef Vedral , Martin K í

Pyrometric Method of Temperature Measurement with Compensation for Solar Radiation

Henryk Madura , Mariusz Kastek , Tomasz Sosnowski , Tomasz Or anowski

A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain

Barbara Stawarz-Graczyk , Dariusz Dokupil , Pawe Flisikowski

How to Use Traditional Spectrum Analyzers for Correct Evaluation of the Human Exposure to Electromagnetic Fields Generated by Wimax Devices

Giovanni Betta, Domenico Capriglione, Gianfranco Miele

Algorithms of Chemicals Detection Using Raman Spectra

Andrzej Kwiatkowski, Marcin Gnyba, Janusz Smulko, Pawe Wierzba

Digital Holography in Flatness and Crack Investigation

Niveen Farid Abdel Maaboud, Mohamed Sadek El-Bahrawi, Fedia Abdel-Aziz

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©2008-2020 OALib, Inc | Public user content licensed CC-BY 4.0 unless otherwise specified. OALib ISSN Online: 2333-9721 OALib ISSN Print: 2333-9705