La indizacion de patrones de difraccion de electrones al alcance de todos y sus aplicaciones: Sistema HCP. Parte II

as it shall be remembered, this work had been divided into two parts. electron diffraction patterns indexation in the hexagonal close-packed system (hcp) will be treated at this opportunity. this is a nonorthogonal system and some diffraction properties are not as evident as in orthogonal systems, by which reason it is necessary to take a little more care when drawing the standards patterns. the hexagonal closepacked will be analyzed geometrically in detail and so the use of three (miller) and four (miller-bravais) indices used for indexation in such system taking into account its advantage and disadvantage, and its relationship with a vector algebra in the reciprocal space. some concepts which had left to search for the novel researcher have been developed in this issue as an attempt to clarify the indexation method proposed here. the structure factor, some times ignored in the conventional method, has been analyzed in deepness and applied to 18/10 stainless steel diffraction pattern, deformed at cryogenic temperature, and to a titanium matrix. the method is mainly directed to novel researchers. nevertheless, expert researchers will find out, surprisingly, that many of the electron diffraction patterns, indexed by using the conventional method, have been bad indexed. selected area diffraction is the method employed.