Estudo da aplica？？o de esta？？es totais para a determina？？o de deslocamentos relativos em laboratório

the accurate positioning has been a challenge to meet the needs of current developments, as in the case of industrial locations that may require sub-millimeter precision in the positioning of equipments and also have limitations related to the area where the work will be performed, making the surveying difficult in some cases. the surveying equipment used in this situation is traditionally classified as high precision ones (angle measurement accuracy of a second and distance measurement accuracy of ±(1mm + 1ppm) or better). the positioning accuracy with total station is limited to the nominal accuracy of the instruments (both angle and distance). in this work the quality of relative displacements measurements of points in situations that simulate an industrial environment was evaluated, where there is limitation in the instrument set up process. the tests were performed in the laboratory, with distances between points and the total station fewer than 5 meters. absolute positioning with total stations will be limited by the nominal precision of directions and distances, so in this research it was tried to evaluate the quality of measurement of relative displacements (distances) of points in situations that simulate an industrial environment where there is limitation in the setup of instruments for the determination of the measurements. in this paper was used a movable structure mounted on the rails of an interferometer. this allows the deformation of displacements to within 0.01mm by using laser measurements. in this structure a prism reflector was fixed, making possible to determine the displacements employing stations total. four models of total stations, with different accuracies were used. the tests were performed in the laboratory, with distances between the points monitored and the position of the total stations fewer than 6 meters. the results showed that it is possible, for this study, to determine displacements with accuracy better than a millimeter, dependi