Radiation Effects in Nano Inverter Gate

Quantum Cellular Automata (QCA) represents an emerging technology at the nanotechnology level. The effects of space radiations in QCA inverter gate are investigated in this paper. Single Electron Fault (SEF) is a fault which may happen during operation of QCA circuits. A detailed simulation based logic level modelling of Single Electron Fault for QCA inverter gate is represented in this paper. It will be shown that the behaviour of single electron fault in QCA devices is not similar to either previously investigated faults or conventional CMOS logic