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Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensorDOI: 10.3762/bjnano.4.2 Keywords: atomic force microscopy , force spectroscopy , lateral forces , mechanical vibrations , qPlus Abstract: In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
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