Conducting Polymer Material Characterization Using High Frequency Planar Transmission Line Measurement

A conducting polymer, poly 3-hexylthiophene (P3HT) is characterized with the metal-insulator-semiconductor(MIS) measurement method and the high frequency planar circuit method. From the MIS measurement method, therelative dielectric constant of the P3HT film is estimated to be 4.4. For the high frequency planar circuit method, acoplanar waveguide is fabricated on the P3HT film. When applying +20 V to the CPW on P3HT film, the P3HT film isin accumulation mode and becomes lossy. The CPW on P3HT film is 1.5 dB lossier than the CPW on SiO2 film withoutP3HT film at 50 GHz.