Total reflection X-ray fluorescence spectrometry – A versatile tool for ultra-micro analysis of objects of cultural heritage

A short introduction into total reflection X-ray fluorescence spectrometry (TXRF) is given. Some aspects of development, including theory, technical advances and publications covering the last 30 years are summarised. The main fields of TXRF applications, trace analysis of elements, micro analysis of solids and surface analysis are presented. A special section describes in detail a gentle micro-sampling method that can be used for the analysis of objects of cultural heritage. The versatility and efficiency of TXRF combined with the micro-sampling of solids for restoration, preservation and art historical tasks are demonstrated using new applications. These examples concern pigment analysis of paintings, analysis of iron gall inks in ancient manuscripts and historical violin varnishes. References are given for further examples. More than 50 references, mainly dedicated to TXRF analysis of art objects, are included.