RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION

In this paper we consider a generalization of the log- logistic distribution called Type-IIexponentiated log- logistic distribution suggested by Kotz and Nadarajah (2000). The operatingcharacteristic for a sampling plan is determined for the case that a lot of products are submittedfor inspection with lifetimes specified by a Type-II exponentiated log- logistic distribution(TELLD). The results are illustrated by a numerical example.