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交联聚乙烯电缆水树修复前后电缆微观结构的变化

, PP. 228-234

Keywords: 红外光谱,老化,硅氧烷,电缆修复,分子结构

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Abstract:

针对XLPE电缆绝缘层水树区修复前后的微观结构变化,本文主要利用红外光谱检测技术(FourierTransformInfraredSpectroscopy,FTIR)观测新样本、老化样本和修复样本分子结构的变化,并阐明其变化原因。老化样本的红外光谱检测结果显示老化样本中水树区甲基(—CH3)、羟基(—OH)基团含量增加,C=O键吸收峰强度加强。说明在电缆老化过程中,电缆XLPE绝缘层存在分子键断裂和氧化降解。而在修复样本的红外光谱中,发现甲基、羟基和C=O键吸收峰强度明显地减弱,C-Si键吸收峰的强度略微增强。同时,利用扫描电镜(SEM)和X射线能谱分析仪对修复样本水树区进行分析,发现水树区中硅元素的原子百分比和重量百分比增加。即修复后电缆水树区的化学元素含量和分子结构发生改变,从而影响了电缆绝缘性能。

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