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SF6中绝缘子表面电荷积聚及其对直流GIL闪络特性的影响

DOI: 10.13336/j.1003-6520.hve.2015.05.009, PP. 1481-1487

Keywords: 表面电荷,绝缘子,SF6,气体绝缘,GIL,特高压直流,闪络,静电探头

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Abstract:

随着中国特高压直流输电工程建设进程的逐渐加快,直流气体绝缘输电线路(GIL)的需求日益迫切,对GIL在特高压直流下一些关键问题的研究显得至关重要。因此针对直流电压下GIL中盆式绝缘子表面电荷积聚问题展开研究,建立了一套基于静电探头法的表面电荷测量系统,研究了在SF6气体环境中,不同电压幅值和电压极性反转情况下绝缘子表面电荷的积聚规律。同时,在特高压直流GIL试验单元上进行了直流闪络试验,研究了绝缘子表面电荷积聚对直流闪络特性的影响。研究结果表明在0.5MPa的SF6中,绝缘子表面主要积聚与所加直流电压极性相反的电荷,这种电荷分布将增大绝缘子表面与中心电极间的局部场强,并将进一步导致绝缘子闪络;GIL中盆式绝缘子的直流耐受电压仅为交流耐受电压的64%左右。该研究为GIL中盆式绝缘子在直流电压下闪络电压下降提供了一种可能的解释。

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