Meeker W Q,Escobar L A.Statistical Methods for Reliability Data[M].New York:John Wiley & Sons,1998.
[2]
陈亮,胡昌华.基于退化建模的可靠性分析研究现状 [J].控制与决策,2009,24(9):1281-1287. Chen Liang,Hu Changhua.Review of reliability analysis methods based on degradation modelling[J].Control and Decision,2009,24(9):1281-1287.(in Chinese)
[3]
Si X S,Wang W,Hu C H,et al.Remaining useful life estimation based on a nonlinear diffusion degradation process[J].IEEE Transactions on Reliability,2012,61(1):50-67.
[4]
Si X S,Wang W,Hu C H,et al.Remaining useful life estimation-A review on the statistical data driven approaches[J].European Journal of Operational Research,2011,213(1):1-14.
[5]
Gebraeel N,Lawley M A,Li R,et al.Residual-life distributions from component degradation signals:A Bayesian approach[J].IIE Transaction,2005,37(3):543-557.
[6]
Si X S,Wang W,Chen M Y,et al.A Wiener-process-based degradation model with a recursive filter algorithm for remaining useful life estimation[J].Mechanical Systems and Signal Processing,2013,35(1-2):219-237.
[7]
Si X S,Wang W,Chen M Y,et al.A degradation path-dependent approach for remaining useful life estimation with an exact and closed-form solution[J].European Journal of Operational Research,2013,226(1):53-66.
[8]
Whitmore G A.Estimating degradation by a Wiener diffusion process subject to measurement error[J].Lifetime Data Analysis,1995,1:307-319.
[9]
Peng C Y,Tseng S T.Mis-specification analysis of linear degradation models[J].IEEE Transactions on Reliability,2009,58(3):444-455.
[10]
司小胜,胡昌华,周东华.带测量误差的非线性退化过程建模与剩余寿命估计 [J].自动化学报,2013,39(5):530-541. Si Xiaosheng,Hu Changhua,Zhou Donghua.Nonlinear degradation process modeling and remaining useful life estimation subject to measurement error[J].Acta Automatica Sinica,2013,39(5):530-541.(in Chinese)
[11]
彭宝华,周经伦,冯静,刘学敏.金属化膜脉冲电容器剩余寿命预测方法研究 [J].电子学报,2011,39(11):2674-2679. Peng Baohua,Zhou Jinglun,Feng Jing,Liu Xuemin.Residual lifetime prediction of metallized film pulse capacitors[J].Acta Electronica Sinica,2011,39(11):2674-2679.(in Chinese)
[12]
王小林,郭波,程志君.融合多源信息的维纳过程性能退化产品的可靠性评估 [J].电子学报,2012,40(5):977-982. Wang Xiaolin,Guo Bo,Cheng Zhijun.Reliability assessment of products with Wiener process degradation by fusing multiple information[J].Acta Electronica Sinica,2012,40(5):977-982.(in Chinese)
